Used TEL / TOKYO ELECTRON P-12XLm #293607561 for sale

TEL / TOKYO ELECTRON P-12XLm
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLm
ID: 293607561
Wafer probers.
TEL / TOKYO ELECTRON P-12XLm is an advanced prober designed to offer high accuracy, reliability and throughput. It is suitable for a wide range of probes and applications including semiconductor device probing and various other modules. This equipment features a high-performance, high-resolution linear motor that is capable of positioning over long distances with high accuracy and repeatability. This prober has an excellent Opto Electric System that provides fast probe scanning for accurate and efficient sampling. The unit also features a Master Slave Configuration with two separate control systems which allows for good synchronization of the master prober and the two slave probers. This ensures the accuracy of the measurement. The software for TEL P12XLM has been designed to offer improved user interface and data handling capabilities. It has an intuitive interface which allows users to quickly access data, as well as an advanced data collection machine which logs test results and helps to streamline the testing process. TOKYO ELECTRON P 12 XLM is also equipped with a variety of sensors which help to detect and monitor the contact force and retest. This tool also comes equipped with a digital probe head which ensures precise and repeatable contact probing. The prober also provides a wide range of test protocols and allows users to customize their test parameters to meet their application needs. The Network Command capability of the asset offers remote control and real-time status updates on the prober. Overall, P-12 XLM is a reliable and robust prober that offers a reliable, repeatable and accurate sampling performance. It offers an intuitive user interface and advanced software to streamline the testing process and provides an extensive range of sensors that enable users to monitor and control the contact force and retest. This prober provides an excellent model for semiconductor device probing and various other related applications.
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