Used TEL / TOKYO ELECTRON P-12XLm #293643224 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLm
ID: 293643224
Wafer Size: 12"
Vintage: 2006
Wafer prober, 12" 2006 vintage.
TEL / TOKYO ELECTRON P-12XLm is a high-end professional prober designed for testing semiconductor chips. Its features include a multi-frequency automatic probing capability, allowing testing at several different frequencies simultaneously, which makes it suitable for testing a wide range of semiconductor types. It also has a high accuracy probe tip and its sample compensation circuitry keeps the sample size at a constant across a range of test conditions, reducing the need for recalibration of the probe. Additionally, it boasts a speed of up to 200kHz, and uses less than 1/5 the energy of comparable probers. The machine is divided into five main parts: the sample holder, control console, measurement equipment, optical system, and probe card assembly. The sample holder is a clamp unit that can hold up to 12 types of samples at a time, while the control console enables users to program the machine and carry out various tests. The measurement machine is the heart of the prober, with features such as a 200MHz real-time Acquisition Data, Automated Acceleration and Electrostatic Discharge (ESD) protection. The measurement tool can also be used to measure -ve substrate distortion and contact pull-off force with a accuracy of up to 0.1µm. The optical asset consists of an optical zoom microscope, an imaging model, and an automated optical vision equipment. The probe card assembly can accommodate up to 20 probes in contact with the surface of the wafer and is compatible with both flat-pack and leaded contact systems. Finally, TEL P12XLM is compatible with various software programs to further customize and program the prober for particular tests and sample configurations. It has a graphical user interface that allows for easy operation, and has built-in safety features such as an over-temperature protection system. TOKYO ELECTRON P 12 XLM is a reliable and flexible prober suitable for large-scale testing needs.
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