Used TEL / TOKYO ELECTRON P-12XLm #293657428 for sale

TEL / TOKYO ELECTRON P-12XLm prober is a top-of-the-line prober used in industries such as the semiconductor industry, the automotive industry and for research and development projects. It is engineered for a wide range of measurement and evaluation applications. The device comprises of both a main unit and a head unit, which are connected via an optical fiber cable. The main unit houses the primary processing and measurement circuitry. It offers a versatile range of features, such as automated programs that enable rapid scan and velocity-adaptive measurement. It also features a drift compensation system, which helps in improving measurement accuracy and repeatability. It supports two types of control patterns typically used in semiconductor production processes: quartz oscillator control and digital frequency synthesizer control. The prober is mounted on an x-y-z stage, with a working area of 400 × 400 mm2 and an automated area of 250 × 250 mm2 (15 to 30 μm accuracy). The stage is designed to reduce vibration, noise and thermal effects, while providing a stable platform for the controlled environment. The head unit contains the probe card and the needle spring, which are used to make contact between the probe and the sample. The prober also comes with a signal video converter, which allows users to monitor signal and waveform measurements. In addition, the prober offers a low dielectric constant (Dk) minimizing environment and UV protection. It features an ultraviolet monitor and filter, which help in isolating UV wavelengths and minimizing heating of the device. The prober also comes with an integrated guard ring system, which helps in enhancing signal integrity and helps minimize noise pickup. The device is also equipped to perform multiple measurement types, such as voltage and current, contact resistance, open/short and integrated test instruments. TEL P12XLM prober is considered to be a reliable and versatile prober, enabling users to perform a wide range of automated and manual measurements. The device is designed to address the increasingly challenging requirements of today's semiconductor industry, enabling researchers and engineers to monitor and evaluate the micro-structure and parameters of integrated circuits and other components.