Used TEL / TOKYO ELECTRON P-12XLm #293657430 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLm
ID: 293657430
Vintage: 2006
Wafer prober MVME Rack No VIP No 147CON No OCR MC01 I/F 316 PST-OPT PST-I/F No PST-STD No SIO GP-IB Robot X and Y Axis arm motor No X and Y Axis motor driver No OCR No laser aligner Chuck aligner Manual plate No C/S Cover Hot chuck ASU X, Y and Z Axis motor No X, Y and Z Axis driver Bridge No tester head adapter Compressor Circulator No temperature controller Monitor Hinge No chiller Cover Power supply 2006 vintage.
TEL / TOKYO ELECTRON P-12XLm is a prober for advanced semiconductor testing. This system is used for probing and testing semiconductor devices and components for reliability and performance. TEL P12XLM is an innovative prober system for the advanced testing of semiconductor devices and components. It can handle high-speed probing and testing of any type of semiconductor device from small packages to large integrated circuits. TOKYO ELECTRON P 12 XLM's design is based on a multi-rework station process, providing advanced testing capabilities with various testing protocols and sampling cycles. TEL / TOKYO ELECTRON P12XLM is equipped with a high-speed servo motor for accurate and rapid positioning of all probes on the device's pins. It also features a precision probing arm with 5-axis movement for scanning the device's PADs. This prober has a large data processing capacity, enabling short cycle time testing and fine-tuning of the test process. Moreover, TOKYO ELECTRON P-12XLm has a high-speed data transfer capability allowing high-speed digital testing of circuits. TOKYO ELECTRON P-12 XLM also features multiple user interfaces, which simplifies the setup and control of the system. This can be done through direct input using a dedicated controller program, or by selecting from several built-in software suites. Furthermore, the prober incorporates overvoltage and overcurrent protection sensors to safeguard the device from damage during testing. TEL / TOKYO ELECTRON P 12 XLM is an efficient testing tool that delivers superior performance and accuracy in the probing and testing of semiconductors. It is an ideal solution for any industrial semiconductor testing applications and is available in both bare board and preloaded formats. Its flexibility makes it suitable for use in manufacturing and repair of semiconductors.
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