Used TEL / TOKYO ELECTRON P-12XLm #293657430 for sale
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ID: 293657430
Vintage: 2006
Wafer prober
MVME Rack
No VIP
No 147CON
No OCR
MC01
I/F
316
PST-OPT
PST-I/F
No PST-STD
No SIO
GP-IB
Robot
X and Y Axis arm motor
No X and Y Axis motor driver
No OCR
No laser aligner
Chuck aligner
Manual plate
No C/S Cover
Hot chuck
ASU
X, Y and Z Axis motor
No X, Y and Z Axis driver
Bridge
No tester head adapter
Compressor
Circulator
No temperature controller
Monitor
Hinge
No chiller
Cover
Power supply
2006 vintage.
TEL / TOKYO ELECTRON P-12XLm is a prober for advanced semiconductor testing. This system is used for probing and testing semiconductor devices and components for reliability and performance. TEL P12XLM is an innovative prober system for the advanced testing of semiconductor devices and components. It can handle high-speed probing and testing of any type of semiconductor device from small packages to large integrated circuits. TOKYO ELECTRON P 12 XLM's design is based on a multi-rework station process, providing advanced testing capabilities with various testing protocols and sampling cycles. TEL / TOKYO ELECTRON P12XLM is equipped with a high-speed servo motor for accurate and rapid positioning of all probes on the device's pins. It also features a precision probing arm with 5-axis movement for scanning the device's PADs. This prober has a large data processing capacity, enabling short cycle time testing and fine-tuning of the test process. Moreover, TOKYO ELECTRON P-12XLm has a high-speed data transfer capability allowing high-speed digital testing of circuits. TOKYO ELECTRON P-12 XLM also features multiple user interfaces, which simplifies the setup and control of the system. This can be done through direct input using a dedicated controller program, or by selecting from several built-in software suites. Furthermore, the prober incorporates overvoltage and overcurrent protection sensors to safeguard the device from damage during testing. TEL / TOKYO ELECTRON P 12 XLM is an efficient testing tool that delivers superior performance and accuracy in the probing and testing of semiconductors. It is an ideal solution for any industrial semiconductor testing applications and is available in both bare board and preloaded formats. Its flexibility makes it suitable for use in manufacturing and repair of semiconductors.
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