Used TEL / TOKYO ELECTRON P-12XLm #293712729 for sale

TEL / TOKYO ELECTRON P-12XLm prober is an automated lightweight prober used for inspecting, analyzing and testing semiconductor devices. It is designed for advanced semiconductor device probing, characterization and fabrication processes. This prober is designed to enable faster device capabilities and a more efficient analysis and testing process. TEL P12XLM features a high speed CCD camera with advanced imaging capabilities, a high precision wafer stage and automated wafer handling. It is equipped with a 10-zone temperature control system that is capable of precisely controlling the temperature of both the workpiece and environment. The prober features a desktop controller that enables easy operation and data management as well as a user-friendly graphical interface. TOKYO ELECTRON P 12 XLM also offers an automatic substrate mapping, enabling the user to quickly map out the characteristics of the substrate. It is equipped with an Automatic Defect Location System (ADLS) that is capable of accurately detecting flaws in the chip and displaying their location on the substrate. Additionally, it features an Analysis Software Package (ASP) that allows the user to analyze and review the data. P-12XLm prober also comes with a wide range of accessories such as automatic chuck clamping mechanisms and various probes that are made to match different applications. This prober is capable of producing high-resolution results, enabling the user to make precise measurements while maintaining accuracy and reliability. TEL / TOKYO ELECTRON P12XLM prober is an extremely versatile prober designed for a variety of different applications and is perfect for semiconductor device testing and probing. It is capable of fast, high-precision operation, providing the user with accurate and reliable results. It is an ideal choice for any semiconductor device testing, probing and characterization applications.