Used TEL / TOKYO ELECTRON P-12XLm #293752228 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLm
ID: 293752228
Vintage: 2007
Wafer prober 2007 vintage.
TEL / TOKYO ELECTRON P-12XLm is an advanced prober designed for high-precision electrical measurement. This powerful and versatile equipment is capable of transitioning through a wide range of positions and is ideal for probing and testing various electronic components. TEL P12XLM utilizes two separate probes, the Touch Lap Shear Prober and the Non-Contact Vector Prober. The Touch Lap Shear Prober enables measurements to be taken directly from the surface of the component and is constructed with a high precision contact tip for accuracy. The Non-Contact Vector Prober allows for the testing of tiny components without causing any damage or wear. Additionally, the system is designed to provide a range of test frequency options, which enables it to measure a variety of parameters including capacitance, resistance, inductance, frequency, noise, IF/NF, and time domain spectra. TOKYO ELECTRON P 12 XLM utilizes a large data processing computer, a high-resolution LCD touch panel, and a USB port to improve its testing accuracy. With the large data processing computer, the unit is capable of capturing waveforms at resolutions of up to 25kHz, and can provide detailed real-time waveform displays. This computer machine is configured with a wafer registration database to ensure accurate data capture and transfer. TOKYO ELECTRON P-12XLm is equipped with advanced motion control, including two precision linear actuators and two dynamic scanning stages. The linear actuators are capable of providing high accuracy and repeatability of measurement positions and angles, while the dynamic scanning stages enable automated scanning for a larger field of view. Additionally, the tool is designed to minimize vibration and air resistance, thus maintaining higher accuracy and repeatability. P-12XLm is an ideal prober for testing and measuring a range of electronic components, from microscopic parts to large wafer arrays, and can provide a wide range of measurements with high precision accuracy. With its optimized design, the asset is able to easily transition from one position to the next, making for easy automation of the testing process.
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