Used TEL / TOKYO ELECTRON P-12XLm #9122509 for sale

TEL (TOKYO ELECTRON) TEL / TOKYO ELECTRON P-12XLm is an advanced semiconductor wafer prober capable of high-precision measurements of ultra-small semiconductor elements in a wide range of processes and materials. It is a versatile tool designed to provide accurate readings of device characteristics such as contact resistance, capacitance, current and leakage values as well as electrical noise. TEL P12XLM is equipped with a high-resolution probing head that can be accurately aligned and finely adjusted to measure each device, even in small geometries. This prober also takes advantage of various functions to ensure precise measurements while minimizing thermal influence factors. TOKYO ELECTRON P 12 XLM has a fully adjustable movement-formed cell (MFC) gantry to suit the dimensions and type of the sample device, as well as a built-in computer to control the functions of the prober. It utilizes a 5-axis positioner and probe system that is designed for a variety of sample types and to quickly locate and contact test points. The automated system is capable of accommodating sample change without manual intervention, thus making the measurement process over large sample sizes faster. The 7-inch wideview LCD operation panel allows the user to view and control the operation and results of the measurement. The prober includes a standard calibration board for validating the measurement accuracy as well as a dielectric calibration sheet for calibrating difficult-to-measure samples such as dielectric layers, insulation, and silicon nitride. It has various safety features such as a large working area and contact fault detection (CFD) for automatic probe recovery. TEL P-12XLm also includes several software options such as the PROBE Manager to efficiently control results and yield data for marketing use, and the SPADE software for analyzing results and creating comprehensive yield reports. P 12 XLM is a powerful tool used in a wide range of mass production applications including semiconductor device testing, reliability studies, device characterization, and device engineering. It is designed with the latest technology to reduce risks and time-consuming operations, enabling users to obtain maximum efficiency from their testing activities. It offers maximum accuracy, stability, and repeatability of results in various processes, making it a reliable and robust semiconductor testing tool.