Used TEL / TOKYO ELECTRON P-12XLm #9161697 for sale

TEL P-12XL is a prober designed for precision wafer level analysis. It is a multi-parameter system that can measure both electrical and physical properties of silicon wafers or semiconductor devices. The P-12XL offers state-of-the-art wafer probing capabilities, making it ideal for both production and research and development applications. Its innovative design features a high-speed scan mechanism, a patented wafer-level optical power supply, optimized power couplings, and a high-accuracy motion control system. The P-12XL is equipped with a range of inputs and outputs to provide a comprehensive range of features, including automated wafer alignment, multiple in-situ electrical analysis channels, and integrated computer control. Automatic wafer alignment ensures accurate and uniform wafer contact, while multiple in-situ electrical analysis channels enable multiple measurements with a single probe. Additionally, the integrated computer control capability makes it possible to manage all data analysis tasks from programmable distance. The P-12XL is also capable of comprehensive environmental control, supporting operations under high-pressure and/or high-temperature conditions. It is equipped with on-board oxygen, temperature, and/or humidity sensors, allowing for detailed analysis of device characteristics amidst the changing environment. This ensures that measurements utilizing the P-12XL remain precise and reliable regardless of the test environment. The P-12XL can be configured to provide not just single-wafer value measurements, but also precise process Parameters such as die effort, I-V curve measurements, loop gain or microwave properties. In addition, the P-12XL's modular design makes it capable of supporting a wide range of applications. By integrating other instruments into the modular system, it can be used for complex wafer-level analysis processes. Moreover, the P-12XL is highly advanced when it comes to data analysis and visualization. It supports the connection of external data acquisition systems, enabling the real-time capture of wafer test results. Additionally, its specialized data visualization software allows users to quickly and accurately analyze data from multiple measurements and evaluate device performance. By utilizing the full range of features that the P-12XL provides, engineers can obtain the highest levels of accuracy and reliability from wafer-level measurements.