Used TEL / TOKYO ELECTRON P-12XLm #9193671 for sale

TEL / TOKYO ELECTRON P-12XLm is a prober developed for advanced semiconductor process testing. This high-performance tool provides reliable probing for a wide range of application scenarios. This equipment uses a mechanically actuated probe head, design to achieve uniform and reproducible contact force during testing. The system also features a vibration suppression mechanism which ensures high-precision detection results, even in noisy environments. The prober has an advanced wafer-handling capability, enabling high-speed probing of packaged parts, wafers and test parts. It is designed with a unique high-resolution optical positioning unit, enabling fast and precise alignment and measurement to a resolution of 2μm. The prober also features a heated stage, enabling thermal stability for semi-conductor testing. This prober is ideal for process characterization and quality control applications. The prober has an automated operation and load/unload capabilities, featuring a rectangular loading area, double carrier wafer support and load-lock door. This machine is capable of measuring from 0.1μm to 1000μm, while maintaining a high throughput rate. It uses a single microscope for both bright field and dark field imaging. The prober is designed with thermal conditioning capabilities, allowing temperature variation from -20℃ to 150℃. It also has a programmable control interface, allowing the user to configure and run tests. Other advanced features include auto sampler compatibility, advanced error detection capability and user-friendly tool management software. Overall, TEL P12XLM's combination of high-precision mechanized probing, vibration reduction, heated stage, automated operation and thermal conditioning capabilities make it an ideal choice for advanced semiconductor process testing and characterization.