Used TEL / TOKYO ELECTRON P-12XLm #9265134 for sale

TEL / TOKYO ELECTRON P-12XLm
Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLm
ID: 9265134
Wafer prober.
TEL / TOKYO ELECTRON P-12XLm Prober is a comprehensive metrology solution designed for use in wafer probing applications. It features advanced automated software, high-precision motion control technology, and a high-resolution microscope for performing accurate measurements. TEL P12XLM is a fully-automated, multi-channel, multi-axis prober with a high accuracy and repeatability. It features advanced linear motor technology to achieve superior motion control performance. For high-resolution, precision measurements, TOKYO ELECTRON P 12 XLM uses an advanced, high-resolution microscope with a digital zoom system. This microscope captures high-resolution images from samples, allowing the user to precisely measure features, such as contacted pads or probe traces. It also features an auto-focus function that automatically focuses on objects in the field of view. For automated wafer probing, TEL P-12 XLM Prober includes a highly-accurate wafer stage with advanced motion control techniques, allowing users to probe wafers with a high degree of accuracy and repeatability. This prober can precisely position wafers using its automated wafer alignment system, allowing raised features to be accurately located. Additionally, the prober's advanced, multi-channel, multi-axis robot arm can probe multiple wafers simultaneously with a high degree of accuracy. Furthermore, P-12XLm Prober also provides users with high-performance data management and analysis tools. This prober supports advanced data analysis techniques, such as overlays, cross-sectional views, and step plotting. Additionally, this prober can be used to store, analyze, and archive probe data in a variety of file formats. Overall, TOKYO ELECTRON P-12 XLM Prober offers users a comprehensive metrology solution for high-precision wafer probing applications. Its advanced software, high-resolution microscope, and precise motion control ensure accurate measurements. Furthermore, its data management and analysis capabilities provide users with a cost-effective solution for probing and analysis.
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