Used TEL / TOKYO ELECTRON P-12XLn/n+ #9261693 for sale

TEL P-12XLn/n+ is a versatile prober that provides users with high performance wafer test solutions. This tool is capable of testing a wide range of advanced wafer structures and technologies, including BiCMOS, CMOS, GaAs, SiGe, and high-k dielectric materials. The P-12XLn/n+ offers rapid test coverage with reliability, accuracy and improved wafer throughput. The P-12XLn/n+ prober is equipped with a high-resolution, four-dimensional wafer alignment equipment, allowing for accurate and precise alignment of the wafers during testing. This alignment system is capable of +/-25 microns in both X and Y axes. Additionally, the prober can measure wafer levels at up to 1.5 degrees in the Z axis, enabling high-accuracy alignment of the wafers. This advanced alignment unit significantly reduces the wafer test times, ultimately improving throughput. The P-12XLn/n+ is also equipped with a patented low-sensitivity wafer handling machine, allowing for less mechanical stress to the device under test. This wafer handling tool is designed to ensure that the wafer remains in correct alignment throughout the test process. Additionally, a fully integrated auto-focus asset helps to guarantee device testing consistency. The P-12XLn/n+ prober also features the advanced CMU-1000 Series control model. This equipment provides powerful and user-friendly programming capabilities, allowing test engineers to quickly and easily program the system with their own scripts. Additionally, the unit allows for the testing of a variety of devices, ranging from very simple structures to complex 3D ICs. The P-12XLn/n+ also offers a robust software package that provides extensive diagnostic capabilities. This includes a wide range of utilities for wafer measurement, alignment correction, automated probe card characterization, and wafer analysis. Additionally, user-friendly graphical user interfaces deliver easier data analysis and reporting. Overall, TOKYO ELECTRON P-12XLn/n+ prober provides users with high-performance wafer testing solutions. Its advanced alignment machine, low-sensitivity wafer handling tool, automatic focus asset, and powerful control model all contribute to the streamlined testing of a wide variety of wafer structures and technologies. The robust software package further enhances the accuracy and consistency of the testing process, ultimately increasing wafer throughput and reliability.