Used TEL / TOKYO ELECTRON P-12XLn / XLm #293773729 for sale

TEL P-12XLn / P-12XLm is a highly advanced prober equipment used in the semiconductor industry for testing and inspecting semiconductor wafers. This prober has been designed and manufactured by TOKYO ELECTRON Limited (TEL / TOKYO ELECTRON), a leading company in the field of semiconductor equipment manufacturing. The P-12XLn / P-12XLm prober is known for its precision, speed, and reliability in handling delicate semiconductor wafers. The P-12XLn / P-12XLm prober is equipped with advanced positioning and alignment capabilities, allowing it to accurately position the probe tips onto specific points on the wafer surface. This precision is crucial in testing various parameters of the semiconductor devices on the wafer, such as electrical characteristics, functionality, and defect analysis. The prober's high-speed control system ensures efficient testing and inspection of the wafers, reducing the overall production time and cost. The P-12XLn / P-12XLm prober features a dual-stage design, with separate stages for wafer handling and probe movement. This design allows for independent control of the two stages, enabling precise alignment and positioning of the probes on the wafer surface. The prober also has a high-resolution camera unit for visual inspection of the wafer during testing, providing valuable feedback on the probe alignment and contact with the wafer. One of the key features of the P-12XLn / P-12XLm prober is its modular design, which allows for easy customization and upgradability to meet the specific requirements of different semiconductor testing applications. The prober can be equipped with different types of probe cards, chuck types, and additional features to enhance its performance and functionality. The P-12XLn / P-12XLm prober is also equipped with advanced software control systems that enable automated testing processes and data analysis. The software allows for easy setup and configuration of test routines, as well as real-time monitoring and analysis of test results. This automation improves the efficiency and accuracy of semiconductor testing, reducing the need for manual intervention and increasing the overall throughput of the testing process. In terms of specifications, the P-12XLn / P-12XLm prober offers a wide range of probing capabilities, including multi-point probing, high-speed probing, and advanced probing techniques for complex semiconductor devices. The prober can accommodate various wafer sizes and types, making it versatile for different testing applications in the semiconductor industry. Overall, TEL P-12XLn / P-12XLm prober is a state-of-the-art testing machine that offers high precision, speed, and reliability for semiconductor wafer testing applications. Its advanced features, modular design, and automated control systems make it an ideal choice for semiconductor manufacturers looking to enhance their testing capabilities and improve production efficiency.