Used TEL / TOKYO ELECTRON P-12XLn #115641 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLn
ID: 115641
Vintage: 2003
Automatic wafer prober Hot chuck Single cassette High rigidity chuck Chuck temperature: 50° ~ 150° Alignment board: VIP3 Single FOUP loader OCR Camera: oblique and coaxial TH clamp GP-IB Cleaning unit: Z-WAPP Z-axis stroke long SACC Cart External printer 2003 vintage.
TEL / TOKYO ELECTRON P-12XLn is a prober designed for semiconductor testing and inspection. TEL P 12 XLN is a cost-efficient yet reliable solution for testing new and existing semiconductor production lines. It provides quick and accurate feedback on product quality, enabling operators to make adjustments as soon needed. TOKYO ELECTRON P-12 XLN features an 8.4-inch color touch screen display, providing clear and understandable graphical data and readouts. It has a wide range of probing tips and angles, allowing for precise and accurate measurement of small structures on the IC's. The prober also supports a variety of probe cards and provides a fast, reliable connection. TOKYO ELECTRON P-12XLn is an automated prober capable of providing accurate, high-resolution images and data analysis. It is able to measure dimple heights, surface roughness and voids and has a powerful built-in statistical analysis function to display the deviation between different measurements or different test parts. Another key feature of TEL P-12XLn is its ability to reach any test point without costly wiring changes. Primary test points and bypass mode ensure reliable, repeatable measurements and save time and money. P-12 XLN also features a wide control range that can cover a range of IC sizes and designs. P 12 XLN is compatible with major software systems, such as CPL, MQA and INJ, enabling quick and easy data logging, analysis and reporting. The prober is also able to support an Ethernet connection and USB devices, allowing for remote monitoring, data logging and direct connection to other computer systems. TEL / TOKYO ELECTRON P 12 XLN is a reliable and cost-efficient solution for semiconductor testing and inspection. The prober has a wide range of probes, a powerful built-in statistical analysis and is compatible with major software systems. It also has a wide control range, featuring efficient wiring and the ability to reach any test point.
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