Used TEL / TOKYO ELECTRON P-12XLn+ #293595840 for sale

TEL / TOKYO ELECTRON P-12XLn+ is a prober designed for semiconductor, MEMS, and other device testing and inspection. It is a high-performance equipment that offers a wide range of capabilities, including wafer stress testing, die sorting, and flip-chip analysis. With its enhancement of the Prober platform, device analysis has become faster and more accurate. TEL P12XLN+ is capable of testing and inspecting wafers up to 200 mm in diameter. It has a load-in/load-out system that allows it to handle up to 8 wafers at once, while offering stress-free automation and uniformity of loading. The machine also features advanced optics such as a new high-sensitivity CCD microscope, giving it the ability to perform quantitative analysis up to the pixel level. The machine has a phased array laser head that offers a full range of stepper motor and laser power for mapping device features. This allows for scanning speed and accuracy that meet the device requirements. It also features a new measurement head which provides a variety of wafer mapping technologies such as electrical, shape, topography, and laser-induced fluorescence mapping. The new inspection and testing unit not only offers superior performance but also affordability. It is user-friendly and can be easily operated by a single operator. The latest version includes a powerful Windows graphical user Interface that guides the user through the instrument setup and measurement operations. The new hardware and software design of TOKYO ELECTRON P 12 XLN+ provide superior performance and reliability. The machine offers high speed and accuracy with its dual-arm Probe Handler and multiple Probe Heads, while providing a clean and dust-free environment. It also is capable of collecting large data sets with reduced setup time to increase yield optimization. The machine provides flexible applications, allowing users to customize it for various device characteristics. Overall, TOKYO ELECTRON P-12XLn+ is a high-performance, cost-effective prober with the capability to meet the demanding requirements of today's semiconductor and MEMS device testing and inspection requirements. It provides unmatched speed and accuracy, with a flexible and efficient Windows user interface that can guide a single operator through the instrument setup and operation. Its cutting edge hardware and software design makes it the perfect solution for a wide range of device analysis needs.