Used TEL / TOKYO ELECTRON P-12XLn+ #293633967 for sale

TEL (TOKYO ELECTRON) TEL / TOKYO ELECTRON P-12XLn+ prober is a high-efficiency, next-generation probe tester designed for use in semiconductor testing applications. This equipment provides efficient and accurate testing of wafers on multiple surfaces and provides a variety of test programs and support services, including program customization. The system can automatically identify a range of electrical signals and provides a full complement of functions for measurements and test results. The core of the unit is the prober. It is designed for the automation of processes for collecting, transferring, and analyzing electrical signals of a sample. It consists of two different parts, the physical probe and the signal carrier. The physical probe consists of an array of over 12,500 separate pins that contact the surface of the wafer. The signals are then transferred to the signal carrier, which consists of an electric field and a small chip, in which the signals are detected. The machine is powered by a self-contained power supply, and includes an automated data acquisition tool and a computer with a user-friendly graphical user interface. It is compatible with industry-standard programmable automation controllers, allowing the user to customize the asset according to individual needs. The model has the capability to detect faulty boards and generic display options, including data visualization and automated reporting. The equipment also supports both graphical and tabular data analysis and a wide range of test configurations. TEL P12XLN+ system also provides special adhesive tape and test cells. The special adhesive tape can adhere devices to a substrate and act as a medium for measuring electrical signals. The prober effectively measures electrical contacts between a substrate and circuit tester, sample board, probe card, or other devices that can be adhered to the special tape. The unit is also designed for applications such as wafer test, wafer sort and device evaluation. It has been developed to maximize the efficiency of testing, minimize data acquisition time and reduce errors. The fully automated software and hardware machine meets the needs of any production or research application. TOKYO ELECTRON P 12 XLN+ prober is an effective and efficient tool for detecting the characteristics of a wide range of materials and semiconductor devices.