Used TEL / TOKYO ELECTRON P-12XLn #293733140 for sale
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ID: 293733140
Wafer Size: 12"
Vintage: 2005
Prober, 12"
Process: Wafer Test
Front Opening Unified Pod (FOUP) loader
2005 vintage.
TEL / TOKYO ELECTRON P-12XLn is a prober that provides advanced prober technology for the semiconductor industry. The device is designed to meet the high-performance requirements of semiconductor test and probe applications. It is equipped with a multi-probe head system and advanced process control capabilities, allowing for the testing of high density, high speed, and ultra-low power ICs. With a load capacity of 11600g and total movement range of 129mm, TEL P 12 XLN offers an ideal solution for advanced test and high-density IC probing. TOKYO ELECTRON P-12 XLN features a unique high-speed parametric prober controller, allowing the device to probe an IC device within 0.001 seconds. An optical multiplexer is also included to support testing of high speed devices at an unprecedented speed of 20MHz. The device also offers an advanced Automated Process Control (APC) function which allows test engineers to achieve high yields by precisely controlling the probe conditions on a probe by probe basis. Furthermore, the device also incorporates a wide range of high-end material handling capabilities for maximum efficiency and accuracy. With industry leading power consumption and characterization capability, TEL / TOKYO ELECTRON P 12 XLN is able to operate on a variety of different voltage levels. It also supports backside ion milling, allowing for test engineers to perform pre-inspection processes without having to remove delicate device components. Additionally, the device supports an automated high-accuracy phase shift compensation system for accurate skew detection and characterization. TEL / TOKYO ELECTRON P-12 XLN is able to perform with a wide range of packages, including BGA, QFP, PLCC and TSOP. With its comprehensive connectivity options, it is compatible with a variety of different test probes and other devices. The device is also equipped with an intuitive graphical user interface, allowing users to easily configure and control the device. Additionally, the prober's 5-axis motion capability allows for the highest degree of hardware customization. In short, P 12 XLN is a powerful and highly advanced prober, designed to meet the rigorous demands of the semiconductor test and probe markets. By leveraging its advanced process control, high-speed parametric capabilities, material handling abilities, and power efficiency, the device is able to provide unprecedented levels of accuracy and performance that are necessary for advanced test and IC probing.
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