Used TEL / TOKYO ELECTRON P-12XLn #293814003 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLn
ID: 293814003
Vintage: 2003
Probers D230/ADA-K5 Chiller 2003 vintage.
TEL / TOKYO ELECTRON P-12XLn is a prober used to inspect integrated circuits (ICs) during the manufacturing process. It is a high accuracy, fully automated prober that is well-suited for a wide range of applications, including probe card testing and package assembly. TEL P 12 XLN is manufactured by TEL Corporation and is specifically designed for use in cleanrooms to optimise performance. TOKYO ELECTRON P-12 XLN is capable of performing inspections of both ICs and substrates with high precision and accuracy. Its advanced optical measurement systems ensure the highest resolution and positional accuracy. Its high accuracy makes it ideal for checking the thickness of a package, the position of the die, the wafer shape and the alignment of the ICs on the die. It also offers advanced image analysis technology and pattern recognition algorithms to precisely measure shape, size, and pattern of ICs. TEL P-12 XLN is a fully automated equipment that is designed to be easy to operate and maintain. It is equipped with an intelligent auto-tuning system which makes it easy to adjust the settings for different semiconductor manufacturing processes. The unit also features a fast switching time between different inspection modes and accurate centering for higher accuracy and consistent results. The robust TEL / TOKYO ELECTRON P-12 XLN features an efficient computer controlled die matrix and several safety features including end-of-period abortion and a die shift prevention machine. Additionally, it offers low vibration measurements and its low noise level makes it suitable for a variety of applications. It also provides two types of scanning modes; Contact scanning mode and Non-contact scanning mode, allowing the user to adjust according to the applicable semiconductor manufacturing process. TOKYO ELECTRON P 12 XLN is an advanced inspection prober that offers high precision and accuracy. It is capable of inspecting both ICs and substrates with exceptional resolution and is an ideal solution for probe card, package assembly and cleanroom applications. TEL / TOKYO ELECTRON P 12 XLN offers a number of useful features such as its fast switching times, automatic tuning tool and its advanced image analysis and pattern recognition algorithms. All of these robust features make TEL P-12XLn an excellent choice for any IC inspection needs.
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