Used TEL / TOKYO ELECTRON P-12XLn #9044933 for sale

TEL / TOKYO ELECTRON P-12XLn is an advanced prober designed for high-quality wafer probing and testing of semiconductor and integrated circuits. The prober is designed for use with a variety of applications, from testing transistors, integrated circuits and equipment-on-chips, to probing high-pin-count DRAMs and memories. TEL P 12 XLN offers high reliability, repeatability and process control, allowing users to quickly and accurately perform wafer-level testing in real time. TOKYO ELECTRON P-12 XLN is equipped with a motion-control system, composed of a multi-axis, ultra-precision XYZ-stage, a rotary stage, and a load port. This unit provides precise and stable wafer alignment, as well as sub-micron step and repeat registration accuracy. TOKYO ELECTRON P-12XLn also comes with a multi-probe and handling cartridge, which enables high-speed probing, even with complex and high pin-count devices. Furthermore, the integrated I/O ports provide quick and easy connection to an external host computer for data acquisition and programming. The design of P-12 XLN allows for simplified maintenance, with fewer moving parts and an efficient cooling machine. Its open architecture helps keep the machine clean and free from particles, while its air-sealed chamber helps prevent contamination. Its advanced alarms, display and controls provide real-time feedback, enabling technicians to quickly identify and fix any problems. P-12XLn is equipped with a variety of sensors and safety features, including an overload and current sensor, pressure detector, and an airbag tool. With its advanced monitoring, TEL P-12 XLN can detect contamination, overcurrent, and even over-pressurization, allowing users to prevent and eliminate any unexpected failures. P 12 XLN is a highly advanced and reliable prober asset. Its multiple, high-precision XYZ axes, integrated I/O ports, and advanced safety features ensure fast, accurate, and high-quality wafer testing and probing. Overall, TOKYO ELECTRON P 12 XLN is an excellent model for automated wafer probing, testing, and failure analysis.