Used TEL / TOKYO ELECTRON P-12XLn #9131720 for sale
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ID: 9131720
Wafer Size: 12"
Vintage: 2004
Prober, 12”
Gold
Hot
200v
Power cable
Head plate
Gas-spring on headplate
Standard monitor
WAPP-20K with brush
Card holder
Manipulator
Wafer table
Boards:
147-CON
VIP3A
GP-IB
TVB9003-1316
PST-STD
PST-OPT
Loader driver
SIO
2004 vintage.
TEL / TOKYO ELECTRON P-12XLn prober is a semiconductor testing tool designed to provide precise electrical testing and alignment of extremely small structures within a given die. Through the combination of high resolution alignment system and an automated prober, the machine ensures all functions are achieved with an accelerated cycle time, offering an increased throughput to meet production requirements. TEL P 12 XLN is capable of providing two levels of alignment, offering both an X-Y and a Z-axis. Using a special optical system, the X-Y alignment allows the machine to quickly and accurately measure the distance between features on a given die, allowing for precise contact measurements. The Z-axis alignment allows the probe to make contact with the precise location on the circuit. The accuracy and speed of the alignment process ensure precise contact measurements and efficient testing cycles. The machine also allows for a variety of wafer chuck sizes and makes use of an automated vacuum probing system, which is capable of automatically resetting the probes after test cycles, ensuring that no contact damage is done during testing. Additionally, the machine allows for a variety of probe types to be used, including lasers and a multiple independent probes, providing versatility for different testing requirements. The machine can also be equipped with a variety of accessories to offer additional functionality. These include the ability to test multiple circuits simultaneously, optical beam steering alignment, automated adjustment of the probe angles to improve contact precision and data logging capabilities to monitor and analyze testing results. TOKYO ELECTRON P-12 XLN provides efficient, precise testing and alignment of semiconductors, with a range of useful accessories and functions to meet various testing requirements. This allows for higher throughputs, improved precision, and detailed data analysis, providing a valuable testing asset for any semiconductor testing laboratory.
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