Used TEL / TOKYO ELECTRON P-12XLn #9161691 for sale
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ID: 9161691
Vintage: 2004
Prober
Loader unit: 1
Lcd panel: With touch panel: Yes
Signal pole: Red/Yellow/Green
Front & rear cover: Red/Blue/Yellow / green: White
Inspection tray : Yes
Certificate: No
Configuration settings
System disk: HDD
Mo disk: (Data storage): No
Fd disk: (Data storage): Yes
Probe_card holder
Loader: Front one load_ port (indicator is brooks type)
Needle alignment: Yes
Needle height setting
Wafer id reading (ocr): No
Needle inspection: Yes
Multi-pass probing: Yes
Gp-ib I/f : Yes
Ethernet I/f
Automatic card change: Yes
Pc unit: 200V/20A
Hinge: Yes
Chuck temperature: There is possibility of the low temperature trouble
Chiller: Yes
Printer Option: No
Size (D x W x H)
Weight(kg): 2506
CPU : VIP3
2004 vintage.
TEL / TOKYO ELECTRON P-12XLn is a high-performance prober designed for production and R&D testing applications. It is capable of performing high throughput and high accuracy probing on semiconductor, electronic, and optoelectronic devices. TEL P 12 XLN is an automated equipment that offers a high degree of flexibility to accommodate a variety of challenging product types. TOKYO ELECTRON P-12 XLN uses a combination of positioning, electrostatic actuation, and compound motion (X-Y-Z and theta motion axes) to move the probe tip to probe contact points on the substrate of interest. The prober also utilizes a "force control mode" to guarantee accurate and repeatable probing results. This force control mode allows users to adjust the probe stroke, speed, acceleration and deceleration to ensure consistent results. TEL P-12XLn has a resolution of 0.1µm and is fully programmable by GDSII, DXF and ASCII formats. This makes it ideal for applications where the accuracy and repeatability of probing results are critical. The prober also includes an automatic alignment function to make sure that the probe angle is aligned correctly relative to the substrate edge. TOKYO ELECTRON P 12 XLN includes a wide range of additional features to improve efficiency and performance. These features include an automated self-cleaning system to keep the probe and substrates clean, an auto-calibration unit to make sure that the probe is always at the correct height, and a probe recognition machine that automatically searches the wafer surface for probe contact points. In addition, P 12 XLN is designed with a high-speed memory storage tool for testing results, a 256-bit SSL encryption for secure data transmission, and a built-in diagnostics monitoring asset that can detect errors in order to prevent any potential problems from affecting the test results. Overall, TEL / TOKYO ELECTRON P 12 XLN is a powerful, reliable, and precise prober for a variety of production and R&D testing applications. With its high-speed and high-accuracy performance, it is capable of efficiently producing reliable probing results. The wide range of features and additional capabilities makes it an attractive choice for any demanding testing environment.
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