Used TEL / TOKYO ELECTRON P-12XLn+ #9172273 for sale
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ID: 9172273
Vintage: 2005
Prober
Hot / Cold chuck temperature: Cold chuck -25~150 (D240)
Chiller: D240
Gold / Nickel chuck: Nickel
Hard driver: Yes
Floppy driver: Yes
OCR: No
Dual / Single cassette: Single
Fail mark inspection: Yes
Needle inspection: Yes
APC / SACC (Motor/Air/Cart): SACC Flip
Marking by category: Yes
Auto needle alignment: Yes
Auto needle height: Yes
TTL: No
GB-IP Interface: Yes
RS232: No
Ethernet: Yes
Off siten marking. No
Cleaning option / WAPP: Yes, (WAPP)
External printer: No
Internal Printer: No
TTL Cable: No
GP-IB Cable: Yes
Marker unit: No
Connecting tester: T5375 / T5377
Hinge type: T5375 / T5377
Hinge: Yes
Ring type: T5375 / T5377
Convertion kit: Yes
OS: Rzz00-R014.08QH
Configuration disk: Yes
Board list: Yes
VIP3: Yes
Voltage: 200V AC
MO/MI VB0004-1/147CON
Interface
MR-MC01
I/O Channel TVB9003-1 316
PST-OPT
PST-STD
2005 vintage.
TEL / TOKYO ELECTRON P-12XLn+ is a semiconductor prober designed for reliability, accuracy and throughput. This high-end prober comes with an integrated operation control terminal, allowing users to easily configure and monitor the system. TEL P12XLN+ is equipped with an orbital movement mechanism; this feature helps to ensure high measurement accuracy and repeatability by enabling the probe to accurately track the sample's movement during the measurement process. The prober is also equipped with a number of additional features, such as an Auto Shock / Temperature Compensation algorithm designed to reduce circuit probing errors caused by variations in temperature and shock. Additionally, TOKYO ELECTRON P 12 XLN+ is designed to provide a high-speed, low-noise measuring environment, enabling a high throughput of samples. In terms of safety, TEL P 12 XLN+ is designed to reduce exposure to RF radiation and electrostatic discharge. It is UL certified and conforms to RoHS environmental standards. With its advanced measurements capabilities, excellent reliability, and superior safety standards, TOKYO ELECTRON P12XLN+ is a suitable option for semiconductor probers and testing environments.
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