Used TEL / TOKYO ELECTRON P-12XLn+ #9199892 for sale

TEL / TOKYO ELECTRON P-12XLn+ is an advanced prober used for contacting and test probing of high-density electronic circuits. It accurately measures electrical characteristics of very small components, and its low thermal distortion plus high-speed scanning make it suitable for use with integrated circuit (IC) chips. This prober takes up to 48 digital outputs and also offers versatility of handling different kinds of substrates up to 300 mm. TEL P12XLN+ prober is a customized solution designed for superior surface and electrical probing. Its variable plane alignment capability for non-contact probing features a four-way independent adjustment roll head, providing better probing accuracy and better inter-chip gap uniformity. In addition, this prober incorporates a coaxial signal inspection equipment for transistors and diodes that provides high accuracy, repeatability, and lower thermal distortion. Furthermore, the system includes an auto-focus loop and a mechanical shutter that increases probing efficiency. TOKYO ELECTRON P 12 XLN+ prober offers an easy-to-use operation panel and built-in error detection unit. It is also available with power supply control to create flat and stable substrate temperatures for more reliable testing. The machine has an optional die-eject tool that makes it suitable for large integrated circuits. And the prober includes a multi-axis heater module that accurately sets and maintains the temperature range of the response surface. TEL P 12 XLN+ asset supports automated testing of various devices. It also offers multiple scanning modes and advanced statistical process control (SPC) features. The SPC functions provide real-time data monitoring for greater process control and model reliability. The prober is equipped with a comprehensive probe card diagnostic package that helps identify and disable faulty probes for improved performance. TOKYO ELECTRON P12XLN+ is integrated with a range of data capture and analysis utilities that enable engineers to quickly and effectively analyze test results and obtain meaningful insights. The equipment also supports external test and measurement tools for evaluating test results. This prober is ideal for high-density applications that require precise electrical characteristics measurement. It offers superior performance and is an ideal solution for integrated circuit testing and characterization.