Used TEL / TOKYO ELECTRON P-12XLn #9222571 for sale

TEL / TOKYO ELECTRON P-12XLn is an advanced prober designed for precision wafer probing. It is a equipment capable of detecting and performing measurements on extremely small features on a wafer level. The prober features a large working area that can probe a maximum of 2200mm x 2200mm, with a minimum probing area of 300mm x 500mm, giving the system high levels of flexibility. It also has a fast focusing unit that can support both static and dynamic focusing, providing excellent accuracy and stability during the probing process. TEL P 12 XLN has an advanced closed-loop servo machine that utilises two linear stages and two rotary stages. This is combined with a high-speed optical encoder for precise and stable position control, allowing for tremendous accuracy during the probing process. It also features a built-in laser alignment tool for quick and easy alignment of the probing beam with the object being probed. This ensures minimal errors when measuring complex structures, such as submicron features, on a wafer-level basis. The prober is equipped with advanced optics, such as a 5-plane diode laser that provides precision alignment with the highest levels of accuracy. Additionally, it features a multi-aperture optics asset for enhanced signal-to-noise ratio and uniformity, supplying consistent highly accurate measurements. The model also offers a variety of probing cards to suit various probing needs, such as measuring contact resistance, leakage current, individual junction capacitance, and residual charges. In terms of usability, TOKYO ELECTRON P-12 XLN has a built-in graphical user interface (GUI) to make operation simpler, as well as a maximum of 10 user operable buttons and 6 knobs. It also has Ethernet and RS-232 interfaces for external data communication. This prober is designed to handle extreme probing conditions, such as large and heavy probes and electrical noises. P 12 XLN is an advanced prober designed for precision wafer probing. It is capable of detecting and performing measurements on extremely small features on a wafer level with great accuracy and performance. It features an advanced optical equipment, closed-loop servo system, and built-in graphical user interface for easy operation. With its great flexibility and numerous features, TEL P-12 XLN is an ideal choice for those who require accurate and reliable wafer-level probing.