Used TEL / TOKYO ELECTRON P-12XLn+ #9228674 for sale

TEL / TOKYO ELECTRON P-12XLn+ is a prober designed for modern semiconductor technology. It is equipped with the latest technology and user interfaces for efficient measurement and analysis of device and interconnect parameters. It is widely used in the areas of amplitude and statistical analysis, die and interconnect characterization, process optimization and yield improvement. TEL P12XLN+ is equipped with a 12-inch substrate holding chuck and offers users multiple positioning and measurement capabilities. It comes with a standard probe arm, which is capable of rotating in all directions and is equipped with a variety of probes, including thermal and micro-manipulators, and a quadruple lens microscope. It also includes a variety of image processing and analysis tools. The arm can move, and rotate with a maximum speed of 600arm lengths per minute, and is equipped with pressure feedback to accurately measure probe forces. To facilitate device and interconnect measurements, TOKYO ELECTRON P 12 XLN+ is equipped with a high-performance scanning electron microscope, which enables users to capture highly detailed images of the device under test. The microscope is equipped with a 20-inch long-working-distance objective lens, achromatic and apochromatic condensers, and a spot size of 5nm. It also comes with a variable-magnification stage for measuring device features in the nanometer range. The system's powerful data acquisition and analysis functions allows users to obtain detailed information from devices and interconnects. It comes with data logging and graphing capabilities, which allow for effective history tracking and comparison of samples. Furthermore, P 12 XLN+ is equipped with direct interfaces to both analytical test systems as well as automated probers. In addition to providing a comprehensive range of measurement and analysis capabilities, TOKYO ELECTRON P-12XLn+ also offers users the ability to customize their systems and design custom measurement and analysis programs. With flexible hardware and software configuration options, users can create a tailored prober that meets their exact needs. Overall, TEL P-12XLn+ is a highly advanced prober designed for efficient device and interconnect characterization. It offers powerful data acquisition and analysis capabilities, as well as customizable options for tailored systems, making it a valuable tool for semiconductor companies.