Used TEL / TOKYO ELECTRON P-12XLn+ #9230417 for sale
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ID: 9230417
Vintage: 2005
Prober
Gold chuck, 12"
Chiller type: D230
CPU type: VIP3A
Manipulator
No RS232
GP-IB
WAPP
No SACC
OCR
Wafer loader: Right
2005 vintage.
TEL / TOKYO ELECTRON P-12XLn+ is an advanced semiconductor testing prober specifically designed for small dicing areas, fine pitch probing, and ultra fine wiring/pad probing applications. It offers tools to accurately and quickly measure die parameters, including proof readings, high resolution wire pad measurements, and electrical parameter readings. This prober is well suited for a variety of semiconductor devices related measurements, such as wafer-level probing, and characterizing small ICs. TEL P12XLN+ features a heavy duty steel frame, measuring 1200mm by 700mm and boasting a maximum probing height of 500mm. This prober is designed with a large-shafted X-Y-Z mechanism and can handle wafer sizes up to 300mm in diameter. TOKYO ELECTRON P 12 XLN+ is equipped with two high-speed scanning paths with a maximum probing speed of 600mm/s, allowing for fast, accurate vertical probing. Its X-Y-Z motion is also optimized for robustly and correctly probing on the different parts of a wafer. P-12XLn+ also features a built-in die-sorter feature that can automatically group die on the wafer after probing. This feature is designed to optimize wafer probing efficiency and reduce manual handling of die. In addition, this prober has the ability to store multiple Wafers and recipes, making it the ideal prober for high volume testing. The user interface of P 12 XLN+ is highly intuitive and makes setting up experiments and data collection easy. This prober supports multiple software applications and allows users to customize each function according to their needs. This prober's auto-start function allows for one-button automated probing. In conclusion, TOKYO ELECTRON P12XLN+ is an advanced prober designed for both general-purpose wafer probing and special-purpose small device testing. It is designed with heavy-duty steel frame, two high-speed scanning paths and a die-sorter function, giving it the maximum levels of flexibility and accuracy. In addition, its intuitive user interface and auto-start capabilities makes experimentation and data collection effortless.
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