Used TEL / TOKYO ELECTRON P-12XLn+ #9230418 for sale

TEL / TOKYO ELECTRON P-12XLn+ is a prober used in the semiconductor industry for electrical and optical testing. This prober is designed to be a Fully Automated Solution (FAS) for probing, which allows for more efficient throughput and higher yields. It is equipped with an Automated Electrical Test System (ATES) and uses a combination of Optical Focus Analysis (OFA) and Vision & Alignment (VA) for precise visual inspection of semiconductor wafers. TEL P12XLN+'s ATES system automatically probes and accesses the electrical properties of semiconductor wafers and allows the user to make precise settings based on provided parameters. This setup ensures that the wafer is tested according to the manufacturer's specifications and the market's production requirements. The FAS offered by TOKYO ELECTRON P 12 XLN+ reduces setup times and training times required by other probers used in the semiconductor industry. The OFA and VA used by P-12XLn+ allow for a more precise visual inspection of the semiconductor wafers. The OFA system is capable of identifying defects on the wafer quickly and accurately, helping the user to distinguish between a defect and a normal feature on the wafer. This feature allows the user to identify potential problems that need to be addressed to ensure a successful product. The VA uses a high-resolution optical microscope to measure the location and size of a defect. This helps the user to identify potential defects before they become a problem in the wafer's production process. P 12 XLN+ provides the user with an exceptional user experience. It is designed to be easy to use, allowing the user to quickly and easily access the wafer features with the press of a button. The user-friendly interface offers a range of settings and parameters that are easy to understand and customize. The comprehensive information provided by TEL P-12XLn+ helps to ensure that the wafers are tested according to the desired production parameters. TEL P 12 XLN+ is one of the most advanced probers in the semiconductor industry and is capable of delivering reliable and accurate results. Its FAS and ATES systems make it an ideal choice for rapid product testing and accurate evaluation of wafers. Its robust and easy-to-use user interface and its superior visual inspection capabilities make it an ideal choice for efficient testing of new projects.