Used TEL / TOKYO ELECTRON P-12XLn #9236130 for sale

TEL / TOKYO ELECTRON P-12XLn Prober is an automated prober designed to examine the performance of various semiconductor components. The prober is well-suited for testing high-performance designs such as dual-gate FETs and analog components. It is capable of probing up to 600pin parts with a minimum 0.1μm gap accuracy, and a high-resolution of 256 pixels per mm. Additionally, the prober can accommodate and measure contact pad geometries with a 1.0 mil trace/space width. TEL P 12 XLN is powered by a high-speed, stepper motor-powered multi-axis motion platform for alignment and multiple interface mechanisms for the contact of the sample and the analyzed signal. The prober features both manual and computerized interfaces, enabling robust signal analysis and test development. The equipment offers a variety of probe and signal conditioning hardware, such as a dual gate FET tester, contact checker, and signal generator. TOKYO ELECTRON P-12 XLN is also equipped with sophisticated electronics, which allows a wide range of operation modes and functions, including a high-speed scanning capability, automatic handling of measurement waveforms, automatic probe compensation, and automated switching between multiple test conditions. P-12 XLN can analyze and measure a wide range of signals, such as DC, AC, and waveform-generated waveforms. The system also provides various statistical tools for recording the waveforms for further analysis. Moreover, TEL / TOKYO ELECTRON P 12 XLN is equipped with multiple image, color, and sound processing capabilities, allowing the user to easily interpret the waveforms' characteristics. The unit comes with beam and ring imaging systems, allowing the accurate positioning of the probe trace and prober electrodes. This ensures that the prober can accurately contact the device under test. Additionally, P 12 XLN includes a temperature control machine, enabling the temperature of the contact pads and sample to be accurately monitored. P-12XLn also features various mech-tools for enhancing the tool's reliability and performance, such as a dust scriber, dust blaster, and dust sucker, as well as a presser and pick-up asset for device handling. All these tools, along with the motion platform, enable a controlled and precise performance of the prober. The prober is compatible with various test devices such as oscilloscopes, digital multimeters, and logic analyzers. In conclusion, TEL / TOKYO ELECTRON P-12 XLN Prober is an advanced tool for testing high-performance semiconductor components. The prober features a wide range of features and tools, including a high-speed scanning capability, automatic handling of waveforms, automatic probe compensation, and automated switching between multiple test conditions. Furthermore, the prober is equipped with different image, color, and sound processing capabilities that enable the user to effectively interpret the waveform characteristics. All these features, in addition to the mech-tools and temperature control model, make TEL P-12XLn an ideal tool for a variety of prober testing applications.