Used TEL / TOKYO ELECTRON P-12XLn #9236140 for sale

TEL (TOKYO ELECTRON) TEL / TOKYO ELECTRON P-12XLn prober is an automated probing tool that performs electrical testing of microelectronic and semiconductor components. The prober is designed to handle a wide range of microelectronic materials and devices, from flip chips to multilayer boards, and is designed to provide accurate and reliable measurement results for comparative analysis. TEL P 12 XLN utilizes a 16-column platform, enabling simultaneous probing of up to 16X separate components. The custom PC-based controller offers a wide range of probes and optical configurations, allowing flexibility and ease-of-use. The probers advanced and precise vision system allows for quick and accurate positioning of probes, allowing for repeatability in sample placement. TOKYO ELECTRON P-12 XLN also supports a wide variety of probe tips, such as small-tip capacitors, inductors, crystal oscillators, and hall effect sensors, allowing for extended device/material coverage. Additionally, the prober features real-time wafer dresser position and plane recognition, allowing for precise sample size recognition and automatic plane switching. The prober also includes a wide range of probing options, including vertical, lateral, and rotary-motion clamping. This enables a variety of probing styles and the capability to handle ultrafine pitch, wide-range solder bumps, and large-scale, multi-layer substrates. The prober also offers a variety of probe force settings for fitting various material types, as well as a range of probing speeds, to ensure adequate performance for applications with varying complexity levels. The prober also features comprehensive software control, which provides for fully automated control of all system operations, including device loading, probed measurements, probing recipes, and results download. This allows for complete traceability of probing operations and results, enabling the user to acquire detailed and accurate results. TEL P-12 XLN prober offers reliable, accurate results and is suitable for high-speed and high-precision probing of a wide variety of materials. Its user-friendly features and intuitive software control provide the ability to quickly and accurately verify device performance and connectivity, as well as offer a solid platform for comparison and analysis.