Used TEL / TOKYO ELECTRON P-12XLn #9254858 for sale

TEL / TOKYO ELECTRON P-12XLn is a prober for measuring multiple parameters of semiconductor devices, such as electrical current, thermal resistance, and voltage. It is designed to perform these measurements at a high resolution and accuracy. TEL P 12 XLN is equipped with a 12-inch base, where all of the measurement heads, heads drive, power supplies, and other components are mounted. The probe card is mounted on the base assembly and is utilized to make contact to the device under test (DUT). The probe head is driven by a precision PZT (piezoelectric actuator) equipment, which allows precision and quick positioning of the probes to the device under test. The front panel control is used to adjust the contact force of the probes, which ensures accurate tests. It also allows the user to adjust the motion profile of the head to suit the particular device and test requirements. The system is enclosed in a stainless steel case, which houses the RF and power supply unit that provides electrical energy to the probes. This energy is used to activate the DUT and to monitor the electrical response from the DUT to the probe's output. The case is air-conditioned to keep the environment at an optimum temperature and to protect the machine from dust and other particles. TOKYO ELECTRON P-12 XLN has a high-speed analog sensor which can measure various characteristics of a device such as temperature, power and voltage. It also has a digital Multi-Functional I/O (MFI/O) channel, which is used to interact with a device with a high degree of accuracy. The tool is equipped with an advanced Laser Beam Alignment (LBA) asset, which ensures that the probe is placed at the exact spot of a DUT for accurate measurement. Moreover, TOKYO ELECTRON P-12XLn is equipped with several digital input/output channels and Ethernet communication ports, which allow it to be connected to other test equipment, such as electrical simulation software and data acquisition systems. Furthermore, it has several safety features such as a reverse current shutoff and an overvoltage protection model. In conclusion, P-12 XLN is an advanced prober for measuring multiple characteristics of semiconductor devices. It has an efficient and precise PZT equipment, RF and power supply system, advanced Laser Beam Alignment and safety features. It also has robust digital input/output channels and Ethernet communication ports. It is ideal for advanced metrology applications, such as device and chip characterization, device-level wafer testing, and other precision measurements.