Used TEL / TOKYO ELECTRON P-12XLn+ #9274820 for sale

TEL / TOKYO ELECTRON P-12XLn+ prober is a robust, reliable piece of semiconductor testing, inspection, and analysis equipment, designed specifically for characterizing wafers of semiconductor devices. The prober has a wide range of features designed to increase its accuracy and precision when testing semiconductor devices. It is equipped with a three-axis Cartesian coordinate system for Wafer handling and positioning, allowing it to isolate and characterize individual wafers on the device. It has a highly accurate linear motor driven head to ensure optimal, repeatable test location. The prober is also equipped with a vacuum chuck table to provide secure and reliable bonding for wafers during testing. TEL P12XLN+ comes with a high-resolution prober camera that can be used to analyze the precise characteristics of each individual device. This helps increase total test throughput by allowing precise characterization of a larger sample area. In addition to the prober camera, TOKYO ELECTRON P 12 XLN+ comes with an 8-inch hydroxy real-time overhead monitor which is used to display real-time results of all analysis and tests in a way that is easy-to-understand. P 12 XLN+ prober also comes with an intuitive user interface, designed to streamline the semiconductor testing process. This includes a touch screen display which allows for quick response to commands and a graphical overlay of the current measurements and results of the test. P12XLN+ also incorporates advanced measurement techniques, such as multi-level scan analysis, to ensure accurate, repeatable test results. Finally, the prober is designed with an enhanced robot arm system for automated testing, enabling users to quickly and accurately repeat tests without interruption. This automated aspect aids in improved repeatability, increased productivity, and a shortened development process., helping to reduce costs associated with semiconductor testing. In conclusion, TEL / TOKYO ELECTRON P12XLN+ prober is an extremely reliable and accurate piece of equipment designed specifically for characterizing semiconductor wafers. Its advanced features, such as robotic automation and camera-based analysis, help accelerate the semiconductor testing process and ensure accurate results. The intuitive user interface and advanced measurement techniques are also designed to ensure quick and accurate testing of devices.