Used TEL / TOKYO ELECTRON P-12XLn #9276346 for sale

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Manufacturer
TEL / TOKYO ELECTRON
Model
P-12XLn
ID: 9276346
Wafer Size: 12"
Wafer prober, 12" 4156C Tester through switching Matrix B2200A Test head Loader type: Single FOUP open X, Y Probing accuracy: ±1.8μm Optical system: ASU / BCU-Ⅰ Probe card size: Up to 350 mm Wafer cassette: FOUP Constant temperature chuck: 25°C to 150°C (Air cool, +/- 3°C) ATE Low leakage probe card interface Does not include Hard Disk Drive (HDD) No hinge.
TEL or TEL / TOKYO ELECTRON P-12XLn is a precision prober specifically designed to handle fabrication of high-end semiconductor devices. This prober delivers precise results and excellent performance in a high-resolution wafer probing environment. This prober features a 12-inch horizontal stage, high-resolution probe head, and high-speed capacity. The precision prober utilizes an ultra-precise movement, enabling precise positioning and probing of all pins on a device. Its advanced, 3-axis motion system enables accurate probing and contacts alignment. The changeable, high-resolution probe heads allows for testing of high resolution, large area devices. In addition, it boasts an adjustable holding pressure adjustment from 1 to 10 kilograms, tight control of the probe tip pressure to the device surface, and a force sensing system that provides repeatable results. TOKYO ELECTRON prober also has a high-speed capacity for wafer probing, with a testing speed up to 50 evaluations per second. Its excellent vibration isolation performance ensures probe head stability, enabling precise contact evaluation under temperature and environmental changes. The prober also features a compact design, a large wafer size capacity of 8 to 12 inches, and a minimum movement scale of 2µm. The chair is split out into its multiple axes driven by an independent electrical motor, and can reach the entire range of motions required for a high performance prober. With its high precision and performance, TEL P 12 XLN is ideal for probing of any high-end semiconductor devices in a wide range of production environments. It is one of the best wafer probing solutions for meeting the needs of advanced technology.
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