Used TEL / TOKYO ELECTRON P-8 #155265 for sale

TEL / TOKYO ELECTRON P-8 is a prober that is a highly accurate and versatile tool used to measure electrical characteristics of semiconductor devices. This prober has a high performance read channel that can accurately measure electrical space and make quick decisions. The prober operates using a equipment of 'laser-guided' precision stages that ensure accurate results with each use. This system utilizes a series of lasers to align probes to the targeted test area, providing a maximum X-Y resolution of 1 μm. This high degree of accuracy allows TEL P8 to accurately measure electrical characteristics of both devices as small as 8 μm2 or as large as 50 mm2. TOKYO ELECTRON P 8 is designed with an innovative probe control unit that offers a variety of control functions for the user. These functions include variable accelerating and decelerating, changing the probe angle between ± 90 °, and automated adjustment of the probe size and contact force. TEL P 8 also features a software-controlled fast bulk I/O testing capability, which can reduce testing time significantly. This testing capability allows for testing of multiple devices simultaneously, providing rapid results for high-volume production runs. Additionally, the prober also has an integrated image processing unit for non-contact measurement and automation of the wafer and substrate positioning. This image processing machine allows for simple and fast centering and alignment of test items using color vision cameras, light sources, and precision motion stages. The prober is also equipped with a selection of multiple probe cards, which can be customized and adapted to any CAD layout. This proves to be particularly helpful when a dedicated test methodology is needed. Finally, P-8 prober has an innovative built-in air knife cooling tool. This asset minimizes thermal damage to ensure that consistent electrical characteristics are measured. In conclusion, TOKYO ELECTRON P-8 prober is a highly accurate and reliable tool for measuring electrical characteristics of semiconductor devices. Its high-performance read channel, laser-guided stage alignment, variable accelerating and decelerating features, software-controlled fast bulk I/O testing, and integrated image processing model make it a desirable choice for high-volume production runs. Its multiple probe cards and built-in air knife cooling equipment further add to its appeal and make it a great choice for any semiconductor testing need.