Used TEL / TOKYO ELECTRON P-8 #177387 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 177387
Probers With DPIP 1996-1999 vintage.
TEL / TOKYO ELECTRON P-8 is a prober used in the semiconductor industry. It is an advanced wafer prober with a highly precise design, built to measure the electrical characteristics of semiconductor devices. The prober has a powerful wafer clamping equipment which is designed with a patented slotted design to ensure that the wafer is held firmly in place, allowing for extremely accurate measurements to be taken. This system is highly precise and is capable of measuring devices with pitch sizes as small as 80µm. The prober also has the ability to carry out measurements from the front and back sides of the wafer simultaneously, eliminating the need to flip the wafer before measuring the back side, thereby speeding up the process. Additionally, it incorporates 500 simultaneous contacts for accurate testing and measurement, along with a 10mm gap between contact points. In addition to its highly accurate feature, TEL P8 prober also uses high-speed sampling technology to ensure that testing, calibration and correction is done quickly. This feature results in improved speed, accuracy and reliability. Furthermore, its integrated measurement unit helps to ensure highly accuracy by reducing total measurement time. The prober also has several additional features which help to make it one of the most advanced probers available on the market. It has a number of features which make it highly efficient, including a touch screen display, and a wide color palette which helps to make it easier to identify objects and features. Additionally, it also features auto-inflation, which helps to reduce load time and ensures optimal growth. In addition, its advanced inspection machine ensures that all data points are scanned and analyzed before being used. Overall, TOKYO ELECTRON P 8 prober is a highly advanced and efficient prober, built to provide accurate and reliable measurements for semiconductor devices. Its highly precise design and sophisticated features ensure optimal results, and its advanced inspection tool helps to ensure that all data is properly obtained and utilized.
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