Used TEL / TOKYO ELECTRON P-8 #188804 for sale

TEL / TOKYO ELECTRON P-8 is a prober commonly used for semiconductor production testing. This prober can accurately measure the electrical characteristics of wafer samples. It can measure the electrical parameters of voltage, current, and resistance to give accurate data about the device. TEL P8 prober is highly reliable and operates with accuracy and repeatability. It provides precise testing of wafers using four separate probe stations, each with a variety of test fixtures to accommodate different sample sizes. Its operation is intuitive and fast, so test times are minimized. The software interface has an easy-to-use graphical user interface, allowing for easy setup, data capture, and analysis. The performance and accuracy of TOKYO ELECTRON P 8 prober is second to none. It is designed to handle high throughput applications, enabling quick and reliable testing of multiple samples during each test cycle. Automatic temperature compensation and a built-in temperature controller ensure accurate results. The temperature range can be set from-25 to 200 degrees Celsius. P-8 prober has built-in safety systems, such as ESD, low voltage and high voltage sensing, and short circuit protection. The software can also be used for parametric mapping for scanning wafers with varying topography. TEL / TOKYO ELECTRON P 8 uses the latest modern technology and was manufactured to meet the latest standards. It includes a full suite of options, offering a variety of test configurations and customization. The software integrates with other systems, allowing for remote operation and data analysis. In addition, TOKYO ELECTRON P-8 prober boasts exceptional efficiency, providing a powerful resource for production testing. Its software is designed to quickly run and analyze multiple tests, maximizing output. The safety features ensure the safety of operators, and the environmental features minimize environmental impact. TEL / TOKYO ELECTRON P8 prober is a powerful and reliable tool for testing semiconductors and other small-scale devices quickly and accurately. By using the latest technology and features, its high performance enables manufacturers to confidently test and analyze their samples to ensure the highest possible quality.