Used TEL / TOKYO ELECTRON P-8 #293604330 for sale

TEL / TOKYO ELECTRON P-8 is a prober developed by TEL Company that is used in the analysis of semiconductor structures. The device is designed to provide optimal measurement of electrical characteristics in a wide range of applications including device evaluation, process monitoring and development, failure analysis and yield enhancement. TEL P8 prober features a fully automated equipment for accurate data acquisition. It offers a wide scanning range, precise mechanical positioning and an extended probe range up to a few hundred microns. The prober boasts an advanced automatic alignment system that accurately brings the probe needle onto the contact point, enabling precise and repeatable electrical contact and reducing the need for manual probe alignment. TOKYO ELECTRON P 8 also has an integrated laser alignment camera unit that further enhances the efficiency of the measurement process. This integrated machine provides precise alignment of the device's probe needle with the device-under-testing as well as capture of real visual images of the probe/sample surface. The prober also has an integrated data acquisition tool connected to the device's measurement leads that can capture, store, and analyze electrical signals. This asset can perform various tests such as DC IV curves, RF measurements, and RF on-wafer characterizations. Additionally, the prober has a vacuum chuck that maintains both a hard and a soft surface for increased accuracy. The vacuum chuck also features a lift model and a tilt function which further enhances accuracy and reproducibility. Furthermore, TEL / TOKYO ELECTRON P8 prober also features an advanced real-time monitoring equipment which can provide comprehensive feedback on test execution. This system allows experienced users to perform "on-the-fly" monitoring, enabling higher levels of testing accuracy and repeatability. To conclude, TEL P-8 prober is one of the most advanced devices available for efficient semiconductor testing and analysis. Its suite of advanced automation technologies and capabilities offer a wide range of measurement capabilities that can be leveraged to maximize accuracy and efficiency in any test application.