Used TEL / TOKYO ELECTRON P-8 #293620490 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293620490
Wafer Size: 8"
Vintage: 1995
Prober, 8" CPU Type: VIP3A Hot gold chuck Vacuum: ≤-50 kPa Main air / Vac hose size: Ø6 Bernoulli and pad sub chuck Chuck air blower Solenoid block Control board OCR COGNEX Insight 1700 Air pressure: 0.45 MPa - 0.7 MPa SCSIHSD: 70-80% Increased speed Memory: 8G / 16G SD Card SCSI Interface Power: 5 VDC OS: Gzz00-R014.08QH Does not include flat top loaders Power supply: 200-240 V, 50/60 Hz, Single phase, 7.5 A 1995 vintage.
TEL / TOKYO ELECTRON P-8 is a prober device used to measure electrical characteristics of integrated circuits. This tool was developed by TEL and TOKYO ELECTRON Japan, combining their respective strengths and knowledge in precision machining and materials engineering. TEL P8 Prober has a compact design, enabling fast operation and compact sample handling. Its integrated probe head is highly accurate and capable of rapid, accurate measurements. Its lift option minimizes the contact force applied to integrated circuits during testing. This increases production yield and helps reduce downtime. TOKYO ELECTRON P 8 Prober is equipped with an advanced data acquisition system and an embedded software package that allow for easy and accurate data recording and analysis. Its software is designed to facilitate efficient and precise test results interpretation, making it easier to optimize design and process parameters for improved yield and performance. TEL / TOKYO ELECTRON P 8 Prober is highly flexible. It can be operated in an automated mode with user-defined processes for quick testing of a variety of sample parameters. An optional environmental chamber is also available to allow measurements under varying temperature, humidity, gas pressure and vacuum conditions. TEL P 8 Prober has been designed with a modular structure that allows it to be upgraded with additional features and equipment as needed. With its high accuracy and flexibility, it is a versatile tool for accurate and efficient measurement of electrical characteristics of integrated circuits. It is a reliable tool for research, development, and production testing.
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