Used TEL / TOKYO ELECTRON P-8 #293620491 for sale

TEL / TOKYO ELECTRON P-8 is a highly advanced prober that has been designed to effectively test the performance of electronic systems. It uses an incredibly precise laser to measure the properties of integrated circuits, allowing engineers to assess device level performance in a variety of conditions. Such conditions can include extreme temperatures, heat, and shock as well as static and dynamic performance tests. TEL P8 has a variety of features designed to maximize its capabilities and accuracy. Its scanning head features a self-calibrating focus system which intelligently maintains the ideal focal point for each test, ensuring accuracy and reducing the risk of any errors resulting from a misalignment. Its laser diode acts as a precise probe, and its AI feature enables it to detect complex patterns within the circuits and accurately capture these measurements without any interference from external factors. TOKYO ELECTRON P 8 also includes a variety of advanced software that allow for automated testing and an intuitive and intuitive graphical user interface. Through the graphical user interface, engineers will be able to review and analyze a variety of test results in real-time, including testing results at certain operating temperatures, and circuitry characteristics. Users can also access a remote terminal to view the tests on their desktop or workstation and store their data in a secure cloud. The modular design of P-8 also allows for it to be easily integrated with other testing systems and other components. For example, it is capable of direct interfacing with test cells in order to acquire temperature and shock inputs to accurately measure the performance of integrated circuits operating under extreme conditions. Overall, P8 is a highly advanced tool designed to enable engineers to effectively test the performance of integrated circuits in a variety of conditions. Its precise laser probe, AI capabilities, advanced software, and modular design allow for incredibly accurate and reliable tests that can be used to evaluate the performance of electronic systems.