Used TEL / TOKYO ELECTRON P-8 #293622925 for sale

TEL / TOKYO ELECTRON P-8 is a prober specifically designed for advanced research and development of ultra-fine semiconductor devices. This innovative prober utilizes a combination of electrical and mechanical components to accurately test the electrical characteristics of devices such as transistors, photo detectors, lasers, and other semiconductor technologies. TEL P8 is composed of a mainframe containing various components such as an electronic test frame, an electronic test fixture, a wafer stage, a robot arm, and a control unit. The mainframe also houses a number of dedicated electronics including a probe card, a parameter analyzer, and a measurement receiver. The probe card is a central component that is used to make electrical connections between the test materials and the test system. The parameter analyzer is used to measure the electrical characteristics of the test materials while the measurement receiver is used to verify the individual process results. The robot arm is used to position the test materials on the wafer stage and to adjust the height and position of the test materials. This allows for precise configuration of the test materials for accurate and repeatable electrical testing. The test materials are placed on the wafer stage and the robot arm is then moved to the proper position in order to make the electrical connection with the probe card. The test signals are then routed from the probe card to the parameter analyzer and the test results are displayed on the controller unit. TOKYO ELECTRON P 8 is an advanced prober device capable of accurately identifying and analyzing the electrical characteristics of small semiconductor devices. Its combination of electrical and mechanical components allows it to perform repeatable and accurate tests yielding reliable data and results. TEL P-8 is an ideal device for research and development applications that require precise and accurate measurements.