Used TEL / TOKYO ELECTRON P-8 #293627763 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293627763
Vintage: 1999
Prober VIP Tester interface: GPIB and TTL Air: 0.4~0.7 MPA Vacuum: -50 Kpa or less Temperature range: 25°C Power consumption: .0.8 KVA Power supply: 115 VAC, 50/60 Hz, 8 A 1999 vintage.
TEL / TOKYO ELECTRON P-8 prober is a tool used to measure electrical characteristics of wafer surfaces. It is based on the precise measurement of the contact resistance between wafer and a small spherical probe. The prober features high accuracy and reproducibility, as well as a low piezoresistive force measured without contact between the probe tip and sample surface. The prober consists of a probe board that is mounted on a mobile base able to move in X and Y directions, as well as a vertical Z-axis platform that drives the force and contact of the probe. The internal structure consists of three parts: the upper vertical stage, the center and the lower vertical stages. The upper and lower stages are mounted on two column assemblies, and the movable XY stage is placed in the middle. The prober can be powered and operated with a desktop PC, connected through an IEEE-488 interface. It is also equipped with an electronic module that is used to control the Z-axis vertical drive motor and allows the operator to set force and contact pressure of the probe on the wafer surface. The software interface reads the measuring signals and allows the user to adjust the measurement parameters. The prober is built to operate in an environment under 300 Pascal of static pressure. It is equipped with a special optical alignment system and an auto focus feature that allows the user to accurately measure sharply changing surfaces and to adjust the probe contact force easily. The system can be used to measure a variety of electrical characteristics of the sample surface, including stress, surface potential, series and parallel resistance, contact resistance, and leakage current. The prober also comes with advanced features such as a flexible programing language for controlling the Z-axis motor, a unique surface analysis software and a wide range of probes. The prober allows the operator to set up multiple recipes and enable repeatable measurements that are more reliable than manual operations. TEL P8 is an efficient, reliable and accurate prober with extensive features and utilities. Its easy to use, highly accurate and reliable functions provide excellent measurement capabilities for a variety of electrical properties of the sample surface. As such, it is an ideal tool for wafer testing and manufacturing.
There are no reviews yet