Used TEL / TOKYO ELECTRON P-8 #293658787 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293658787
Vintage: 1999
Prober TS100 VIP4 Low temperature Removed parts: CPU HDD FDD 1999 vintage.
TEL / TOKYO ELECTRON P-8 is a wafer prober, used to accurately position wafers, measure and analyze the electro-mechanical characteristics of integrated circuits, such as current, voltage, capacitance, and inductance. TEL P8 consists of an X-Y table, a wafer chuck, four strain guage force sensors, and two vision heads, a main engine, and a main control unit. The X-Y table controls the placement of the wafer chuck, and is capable of moving up to 10nm increments with 0.1nm accuracy across its 86mm travel range. The wafer chuck is designed to hold up to 8 inch diameter wafers, and has the capability of moving up to 6mm with 0.1nm accuracy. It also includes a monitoring system to detect any impact or vibration. The four strain guage force sensors are used to measure the electro-mechanical characteristics of the wafers. The two vision heads are used to inspect the device performance and detect the abnormalities or failure modes. The main engine of TOKYO ELECTRON P 8 is the Atlas command control unit. This unit is capable of controlling all aspects of TOKYO ELECTRON P-8's operations including movement, force sensors, vision heads, and temperatures. Data collected by the unit is represented in the form of vectors, which are then used to generate graphical representations of the characterizations, device performance test, and analysis results. The main control unit of TEL P-8 is the ParaVision M2. This unit is used to control all aspects of the probe's functions including movement, force sensors, vision heads, and temperatures. This unit also stores all the collected data and can be accessed and manipulated in real-time for further analysis. Overall, P8 is an effective tool for accurately positioning wafers, measuring the electro-mechanical characteristics of integrated circuits, and generating graphical representations of the characterizations and device performance tests. This all-in-one system embodies precision and accuracy, enabling users to create reliable results for their applications.
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