Used TEL / TOKYO ELECTRON P-8 #293661227 for sale

TEL / TOKYO ELECTRON P-8 prober is a high-performance piece of semiconductor testing equipment designed to detect and measure the electrical interface characteristics between die and probes in a semiconductor wafer. It is an advanced, automatic equipment for the enterprise-level analysis of microelectronic devices. It is composed of precision mechanical and electrical components including up to eight XYZ stage assemblies, probes, and a probe blade as well as an integrated high voltage influence module. TEL P8 prober has a loading system for convenient and accurate handling of wafers. For probing, the XYZ stage assemblies utilize linear motion and steel ball lead screws on all axis to ensure rapid traversal of the stage. The cutting-edge probes utilize high-precision piezoelectric actuators and adapted probe tips for precise alignment and contact. A high voltage influence module paired with a drain filter has also been specially designed to minimize the effect of stray capacitance and electrostatic coupling. TOKYO ELECTRON P 8 prober can configure, index, and measure multiple points simultaneously. It features an automatic stage calibration with an optical encoder unit as well as a real-time interpolation machine for higher performance and accuracy. It supports advanced data manipulation to enable display of datasheet graphs as well as export of complex data to other applications. It is robust and reliable with minimized downtime due to an automatic fault detection tool and the ability to perform a self-test. TEL P 8 prober provides improved features such as fine delays between measurements to increase accuracy and faster processing of data with its advanced digital delay asset. It also supports a wide range of output parameters including current, voltage, resistance, capacitance, impedance, and Q-factor. Furthermore, advanced feature settings including special tests for probing temperature-dependent effects and ultraviolet-visible (UV-VIS) post-measurement are supported. In summary, TOKYO ELECTRON P8 prober is a high-precision instrument that offers an easier and more accurate method for probing of semiconductor wafers. It supports various measurements of electrical interface characteristics while ensuring a stable and precise environment for testing. It has an array of features that enable the efficient running of complex experiments and testing scenarios.