Used TEL / TOKYO ELECTRON P-8 #293661231 for sale

TEL / TOKYO ELECTRON P-8 is a prober designed to minimize cycle time and acquire accurate data on wafer probing while maintaining high levels of accuracy and reliability in test cycles. TEL P8 system reduces cost through its high-speed, multi-node prober configuration. It provides systems that work together seamlessly, allowing users to maximize wafer testing productivity and move wafers quickly between different testing platforms. TOKYO ELECTRON P 8 is capable of multi-site probing with its multiple robot arms and high-resolution industrial cameras, capable of probing up to eight wafers simultaneously. This cutting-edge technology decreases cycle times and allows simultaneous probing of multiple sites on a wafer, thereby increasing the accuracy of testing data. With TEL P-8, the system software and initialization are fully automated to allow for fast set up and rapid operation. In addition, accurate and repeatable calibration strategies and techniques are incorporated into the system for highest accuracy amongst multiple probe sites, and test conditions. TEL / TOKYO ELECTRON P8 uses the latest vision technology to monitor the wafer probe process, and is capable of detecting problems during the probing cycle and making necessary corrections to maintain accurate results. It runs on an advanced high-speed processor to ensure the accuracy of its probe positioning and the correctness of the test data acquired. Software tools are used to monitor the position, shape and characteristics of the electrical contacts for optimal wafer probing. TOKYO ELECTRON P-8 also employs advanced robotic technology to ensure quick and accurate alignment of the wafer with the probe tip, thereby increasing test throughput and reducing probe and wafer damage. TEL P 8 is designed to be incredibly efficient and reduces manual adjustment, maintenance and downtime. Its state-of-the-art design ensures high-quality results, repeatability across test cycles, and overall reliability. Thanks to its multiple robot and camera configuration, P 8 allows for multi-site probing and simultaneous probing of multiple wafers, thereby increasing testing accuracy and decreasing test time. The result is an efficient, real-time, automated probe platform that can maximize quality while minimizing cycle time.