Used TEL / TOKYO ELECTRON P-8 #293661237 for sale

TEL / TOKYO ELECTRON P-8 is a prober specially designed for electrical probing applications. It is a high-precision, high-speed prober developed by TEL (TOKYO ELECTRON) for the analysis of semiconductor devices under development. This advanced tool is capable of performing a variety of tests, including high-precision electrical and mechanical probing of advanced devices. TEL P8 prober features a highly rigid and compact body which helps minimize vibration and ensures accurate results. The prober comes equipped with an advanced multi-detector probe head capable of working at constant height and pressure, as well as a powerful XY-axis automatic approach system for fast and precise alignment of probes. Its controller is equipped with hardware and software support for automated wafer probing and vectoring. The prober also features a language-independent batch program which can be used to control both probing stages and data analysis tools. Moreover, TOKYO ELECTRON P 8 is designed with improved error-checking capabilities. The prober has the ability to detect and adjust for minor errors or misalignment automatically, thereby saving time and ensuring accurate measurements. Additionally, the prober also offers an automatic question checking system which ensures that users are informed of any possible errors during probing measurements. TEL P 8 prober is capable of performing a wide range of production and development tests. It also offers advanced safety features such as pressure sensors, collision prevention and a control loop lock mechanism. This ensures that users can work without worry, even while performing precision tests on advanced semiconductor devices. In conclusion, P 8 prober is an excellent choice for electrical probing applications. It offers a powerful and reliable design, advanced safety features and high-precision and high-speed operation. Furthermore, the prober supports a number of tests and offers powerful error checking capabilities. As such, it is a valuable tool for the analysis of semiconductor devices.