Used TEL / TOKYO ELECTRON P-8 #293667431 for sale

TEL / TOKYO ELECTRON P-8 is an advanced scanning electron microscope (SEM) prober designed for automated analysis and testing of semiconductor wafers. TEL P8 has been developed to meet the demands of modern semiconductor fabrication processes. It is an innovative platform which combines the capabilities of a state-of-the-art SEM with the convenience of a production-ready wafer prober. TOKYO ELECTRON P 8 offers a full range of advanced features for both high-end analysis and production testing. It features a patented dual-beam SEM, a unique 10-stage motor drive, a large sample chamber, and automated positioners to enable faster sample analysis. TEL P 8 has an intuitive GUI interface which allows for easy setup and operation of the instrument. TEL / TOKYO ELECTRON P8 is capable of executing a wide variety of Surface Analysis (SA) and Electrical Characterization (EC) tests, allowing for rapid understanding of device characteristics. The dual-beam SEM allows simultaneous visual imaging and electrical testing to be performed, enabling rapid evaluation of IC device microstructures. The 10-stage motor drive enables automated wafer handling and stepper motor control. This allows for precise scanning of a large sample area at high throughput rates. P8 is well-suited for both advanced analytical and production-oriented applications. It is highly versatile and can be easily adapted to customized test requirements. Furthermore, TOKYO ELECTRON P8 features a high throughput rate and small sample sizes, making it the ideal choice for production testing, as well as failure analysis of semiconductor devices. This powerful SEM prober is an essential tool for evaluating the physical and electrical characteristics of semiconductor devices. Its combination of sophisticated functionality, automation, and easy deployment make it the ideal choice for device evaluation and production testing.