Used TEL / TOKYO ELECTRON P-8 #293672434 for sale

TEL / TOKYO ELECTRON P-8
Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293672434
Prober.
TEL / TOKYO ELECTRON P-8 is a highly advanced automatic prober equipment designed for a wide range of applications in semiconductor-device engineering and production. In operation, TEL P8 prober system is capable of testing and measuring various electrical parameters, such as resistance, capacitance, current, and voltage, of a wide variety of semiconductor devices. It can be used to measure the parameters of both finished products and newly produced devices. The unit is equipped with a multi-panel LCD monitor, allowing users to change settings and parameters on the fly. Additionally, TOKYO ELECTRON P 8 features a precision X,Y-axis table that allows for the adjustment of tests and measurement points. To ensure accuracy, the X,Y-axis table is thermally stable and operates with minimal vibrations or shaking. Furthermore, the machine has an array of standard probing needles for the measurement of advanced parameters and different wafer types. P-8 prober tool is also equipped with an advanced software package. This package includes an array of user-friendly tools that facilitate the setup, monitoring, and control of tests and measurements. For example, the software package can be used to create and monitor waveform patterns, adjust test parameters, analyze resulting data, and store results. In addition, the software package can be used to generate quality control and calibration reports. P 8 is a highly advanced prober asset, designed for both laboratory and manufacturing use. It is extremely reliable, its high accuracy and repeatability make it suitable for a wide variety of applications in both development and production environments. Additionally, its integrated software suite allows for easy setup and management, while its advanced probing needles make it capable of testing and measure complex electrical parameters. All in all, TOKYO ELECTRON P8 is a highly accurate and reliable automatic prober model, capable of testing and measuring a wide variety of semiconductor devices.
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