Used TEL / TOKYO ELECTRON P-8 #293695992 for sale

TEL / TOKYO ELECTRON P-8 prober is a leading particle metrology tool designed to measure the internal structure of components and materials by using atomic force microscope (AFM) technology. This prober uses AFM probes to scan surfaces at high resolution to accurately measure features such as surface topography, grain size, thickness and surface texture. This instrument is ideal for a range of research and process control applications in various industries such as electronics, materials, automotive and healthcare. TEL P8 prober is built to provide reliable and accurate AFM results. Its core components are carefully selected and certified by experts to ensure maximum accuracy and durability during operation. It is equipped with advanced aluminum alloy structures and storage components, which maintain the stability of the device. It is also powered by a reliable source of electrical energy, which is provided by an efficient amplifier module. Additionally, TOKYO ELECTRON P 8 prober is designed to be user-friendly and can be easily operated by anyone. TEL P-8 prober provides excellent imaging performance, making it suitable for a wide range of research and industrial applications. Using advanced scanning technology, it can acquire both high-resolution 2D images and 3D profiles with a large field-of-view. The prober also features an advanced laser interferometry system, which helps to measure the surface topography of components and materials. Additionally, this device allows users to easily adjust the imaging parameters, such as the scanning speed, to further enhance the data quality. P8 prober also comes with a variety of data storage and output options. In addition to saving data in various formats such as TIFF, BMP and HDF, it can also be connected to a computer for further data analysis. Furthermore, it supports several communication and control protocols such as Ethernet, EIA-232, and USB. This helps to simplify data transfer and workflow. Overall, TEL P 8 prober is an advanced and reliable particle metrology tool. Its robust design, high-resolution imaging capabilities and easy-to-use features make it a valuable tool for a range of research, development and process control applications. With its advanced features, this prober can help to quickly and accurately measure the internal structure of components and materials.