Used TEL / TOKYO ELECTRON P-8 #293710512 for sale

TEL / TOKYO ELECTRON P-8 Prober is a high-precision, high-capacity test tool that can be used to measure the electrical characteristics of semiconductor devices. TEL P8 Prober features a comprehensive range of motion, probe card adaptability, and machine vision capabilities that allow for accurate and rapid testing of various semiconductor materials. TOKYO ELECTRON P 8 Prober is equipped with a unique wafer indexer mechanism that provides precise X-Y-angle positioning and following of the wafer during testing. This mechanism facilitates accurate alignment and positioning of the probe cards, allowing for precise measurements. TEL / TOKYO ELECTRON P 8 Prober can be used with any commercially available probe card, with no additional transportation mechanism required. TEL / TOKYO ELECTRON P8 Prober can also be used for high-resolution probing applications. With its precise motion control system, P-8 Prober is capable of high-positional accuracy for testing both small sample devices and large wafer-level devices. In addition to its superior motion control capabilities, TOKYO ELECTRON P-8 Prober also offers powerful machine vision capabilities. Its built-in vision system allows for fast and accurate alignment of the probes to the pads on the test device, and can also be used to check the quality of the electrical connections on the probe card and/or the test device. TEL P-8 Prober also provides a wide range of probing tools and parameters, allowing for an advanced level of probing and characterization. Its large-scale testing parameter library can be used to conduct up to 8,000 separate test points, with accuracy and repeatability ensuring consistent and reliable results. Overall, TEL P 8 Prober is an advanced, high-performance test tool that is capable of accurate and rapid testing of semiconductor materials. With its wide range of motion, probe card adaptability, machine vision capabilities, and advanced probing tools, P 8 Prober is an ideal instrument for precise measurements and high-resolution probing applications.