Used TEL / TOKYO ELECTRON P-8 #293710521 for sale

TEL / TOKYO ELECTRON P-8 is a prober used for semiconductor and MEMS device testing. It is mainly used for wafer level probing, functional testing and device characterization. It is capable of performing a wide range of test applications, including electrical measurements, device on wafer testing, and parametric testing. TEL P8 prober is a multi-functional prober capable of making various types of measurements on a variety of different types of devices. The prober uses an automated measuring head that can move in the x, y, and z axes. This allows it to make precise measurements, ensuring accuracy and repeatability in the test results. It can measure voltages, currents, and other electrical characteristics accurately and seamlessly. Its built-in robotic arm is able to move and position the needle tip to the exact location on the device being tested. This reduces the time spent calibrating and setting up the measurements. The prober also has several built-in measurement control systems that allow users to control the testing process. These systems can measure parameters such as temperature, voltage, current, capacitance, resistance and inductance. They allow for the test setup to be adjusted for the specific device being tested. With the ability to measure a variety of different parameters, TOKYO ELECTRON P 8 prober is an effective tool for advanced parameter testing. In addition to these features, P 8 prober also features an array of automated features and advanced features. It can measure multiple parameters automatically and with precision, eliminating the need for manual input. It also includes advanced safety features, such as automatic contact checks, to ensure the safety of the device under test. Additionally, it supports remote control and automated data collection, allowing users to collect data easily and quickly. TEL / TOKYO ELECTRON P8 prober is an advanced probe used to rapidly and accurately test a wide variety of semiconductor and MEMS devices. With its automated features and precise measurement capabilities, it is an invaluable tool for device testing and evaluation.