Used TEL / TOKYO ELECTRON P-8 #293742041 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
P-8
ID: 293742041
Wafer Size: 8"
Vintage: 1996
Prober, 8" Nickel plated chuck Hot chuck temperature: 40°-150°C Tester: GPIB CPU Type: IP/DP No ethernet No OCR Camera No inker 1996 vintage.
TEL / TOKYO ELECTRON P-8 is a prober used to measure the electrical properties of a semiconductor device. It is a semiconductor test equipment that allows for high-precision electrical measurement of semiconductor devices at the wafer-level. TEL P8 prober is designed with a high-precision yet compact footprint to meet the expanding needs for wafer prober applications, providing improved wafer probing accuracy, yield, and throughput. It can measure different electrical parameters such as contact resistance, resistance of leads, power consumption and some more. TOKYO ELECTRON P 8 prober operates on the vectorless scanning technique, where the contact displacement and resistance is measured simultaneously. The system is ASIC tested and certified and supplied as a complete component that includes probe cards, head, chuck and software. The Probe Card is designed to hold the probe needles in contact with the wafer being tested. The Probe needles can be precisely adjusted to measure the resistance of a single point up to a large array of points with high repeatability and a wide range of resistances. The probe card is equipped with a cooling mechanism that enables high-precision probing during extended loadings. The head uses a back-drive actuator control unit that enables high repeatability in probe insertion and contact. The chuck uses a vacuum machine to provide a secure grip on the wafer while probing. It also provides a robust level of protection against breakage during wafer transfer. The software of TEL / TOKYO ELECTRON P8 prober is designed to provide a user-friendly testing environment. It contains tools for data acquisition, analysis, and wafer imaging that are essential for successful wafer testing. The software helps operators to customize the test parameters to their needs and also offers setup and process automation. The data generated by P 8 prober can be exported and imported into different formats, facilitating efficient data transfer and analysis. In sum, TOKYO ELECTRON P8 prober provides a reliable and accurate testing tool for semiconductor components. It is equipped with advanced features that enable efficient testing with minimal human intervention. The asset combines a high-precision footprint with a user-friendly software platform, making it an ideal solution for wafer-level testing and analysis.
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