Used TEL / TOKYO ELECTRON P-8 #293742045 for sale
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ID: 293742045
Wafer Size: 8"
Vintage: 1996
Prober, 8"
Nickel plated chuck
Hot chuck temperature: 40°-150°C
Tester: GPIB
CPU Type: IP/DP
No ethernet
No OCR Camera
No inker
1996 vintage.
TEL / TOKYO ELECTRON P-8 is a highly specialized prober used to inspect semiconductor wafers. This prober is a multi-axis equipment with a large range of motion and high levels of accuracy. TEL P8 prober features an XYZ-Theta table that allows for fast, precision alignment of wafers. It has a maximum rotation of 360 degrees and enhanced stage stability, giving accurate and repeatable results. The prober is capable of operating in environments up to 35°C and has an accuracy of ±2 μm. TOKYO ELECTRON P 8 also offers a wide range of probe technologies, which include capacitance, resistance, current and inductance. This allows for testing of a wide range of semiconductor types, including individual ICs, multi-chip modules, and circuit boards. The prober also has a built-in vision system to allow for the accurate alignment of individual ICs and other integrated circuits. P-8 has a built-in real-time temperature control unit for probes, enabling it to perform accurate measurements at high temperature or pressure. This feature eliminates the need for extra cooling components, streamlining the testing process. The prober also includes a robust underlying architecture that provides users with higher levels of reliability, stability and speed. It runs on an FPGA-based platform with a Windows operating machine, giving users a streamlined user experience. Its built-in monitoring and diagnostics features allow users to troubleshoot quickly and easily in the event of problems. TEL / TOKYO ELECTRON P8 is an all-in-one prober that offers the latest technologies in prober automation. With its XYZ-Theta table and built-in diagnostics and monitoring features, this prober is a great choice for testing a wide range of semiconductor devices. Moreover, its range of probe technologies make it an ideal choice for testing individual ICs, multi-chip modules and circuit boards.
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